Sunday, 27 November 2011

MCA QUESTIONS

1) software development tool for microcontroller

2) (a)   diff b/w OS & RTOS
     (b)  what is task, task id? exp diff task states.

3) draw & exp arch of 80196

4) exp timers,HSI,HSO

5) exp memory mapping intel 80196.

6) func of RTX51 tiny version & full version.

7) draw & exp arch of  ARM7 & write any 5 features of ARM7.

8) exp CPSR of ARM7 & exp add modes of  ARM7

9)describe briefly about ISR handling in an RTOS environment.

10) exp mutex management func calls in  RTOS.

Friday, 25 November 2011

cmc imp questions

UNIT 5
  •   Types of antenna used for coverage & interference reduction? exp them.
  •    Interference reduction by direction antenna at cell site
  •  Characteristics of cell site antenna 
UNIT 6    
  • exp the following operational func of excess channel    (a)  FOCC   (b) RECC
  • exp how channel sharing & borrowing increases trunk efficiency of channels?
  • how to solve the prob of heavy traffic non uniform pattern in the sites close to city
  • exp DCA, FCA, BCA, FBCA
UNIT 7
  • force hand off & uses
  • factors influencing the dropped call rate.
  • (a) cell site hand off    (b) intersystem hand off
UNIT 8
  • exp traffic channel in GSM
  • four sub systems of GSM in detail with diagram
  • comp CDMA, TDMA, FDMA
  • req of HLR & VLR in N/W switching subsystem & diff them.

Wednesday, 23 November 2011

EMI 2 MID QUESTIONS

1) PRINCIPLE OF OPERATION OF SINGLE BEAM CRO WITH BLOCK DIAGRAM & FUNCTIONS OF EACH BLOCK.

2)FUNC OF DELAY LINE IN VERT.SEC OF AN OSCILLOSCOPE. DRAW A B.D & EXP OPER OF DELAY LINE CIRCUIT.

3) OPER OF DUAL TRACE CRO IN ALTERNATE & CHOP MODE WITH DIAG & WAVE FORMS. STATE FUNC OF EACH BLOCK.

4)EXP WITH FIG OPER OF MESH STORAGE OSCILLOSCOPE CRT. DRAW THE B.D OF DIG READ OUT OSCILLOSCOPE &  EXP OPER MEASURING VOLTAGE.

5) (A) LISSOJOUS FIGURES MEASUREMENT OF FREQUENCY.
    (B) PASSIVE & ACTIVE PROBES
    (C) CAPACITIVE TRANSDUCER

6) LIST OUT DIFF TYPES OF TRANSDUCERS. DESCRIBE THE OPER OF UNBOUNDED & BOUNDED STRAIN GUAGE TRANSDUCERS.

7) EXP WITH HELP OF DIAG THE METH OF MEASUREMENT OF DISPLACEMENT USING CHANGE IN SELF INDUCTANCE DUE TO CHANGE IN
 (A) NUM OF TURNS
 (B) PERMIABILITY

8) DESCRIBE WITH A DIAG THE CONSTRUCTION OF AN LVDT & ITS OPER FOR MEASURING DISPLACEMENT.

9) EXP THE MEASUREMENT FLOW USING HOT WIRE ANEMOMETER TRANSDUCER.

10) WRITE BRIEFLY THE OPER OF
(A) RESISTANCE THERMOMETER
(B) SYNCHRO'S FOR SHAFT ANGLE MEASUREMENT
(C) THERMISTER MEASUREMENTS.

Monday, 5 September 2011

EMI questions

  1) static & dynamic errors.list out types of errors in measurement.

2)(a)  what are required of shunt? how a basic ammeter converted to multi range ammeter?
    (b) a 10 ma d'arsonwal meter moment having an internal resistance of 100 ohms is used to converted into a                  multi range ammeter having range of 0-1A,0-5a & 0-20A. determine the value of shunt resistance required.

3) (a) how a PMMC can be used as a multi range voltmeter & a series type ohmmeter
     (b) calculate the value of multiple resistance for the multi range dc voltmeter for 0-20,0-50,0-100v whose full scale deflection is 50uA & meter resistance 500ohm.

4) (a) dual type DVM
  (b) compare the performance of electrophoretic image display & liq. vapor display

5) exp operation of
(a) function generator  (b) random noise generator

6) basic analyzer operation & RF Heterodyne wave analyzer.

7) what is spectrum analyzer? exp the operation of (a) parallel filter bank analyzer
                                                                       (b) spectrum analyzer with swept receiver

8) (a) DC whetstone bridge  & diff between basic circuit of kelvin bridge & Wheatstone bridge
    (b) Wagner's ground bridge

9)  Maxwells bridge and problem

10) Anderson bridge & problem